Excellence in Time much more than premium performance
LK Metrology is the only CMM manufacturer to guarantee the original accuracy specification of its CMM for a period of 10 years.
ช่วง ALTERA มีขนาดมาตรฐานตั้งแต่รุ่น 7.5.5 จนถึงรุ่น 60.20.15 ขนาดเพิ่มเติมสามารถขอได้
Enduring accuracy
Enduring accuracy
Ultra-stable ceramic bridge and spindle guideway with
high resolution 0.05 μm optical scales for volumetric
accuracies as low as 0.7μm+L/600.
Precise motion
Precise motion
Granite dove-tail table guideway with unique single
orifice grooved pre-loaded air bearings for
precise motion control at high speeds.
Anti-vibration
Anti-vibration
Self-levelling vibration isolation for optimum
performance in areas subject to high
levels of low frequency vibration.
Shop floor ready
Shop floor ready
CMM Automation for in-line and stand-alone
shop floor measurement solutions with
guideways protected from airborne
contaminants.
The ALTERA series
With throughput, precision, multipurpose, shopfloor and custom
options available, ALTERA is the most configurable CMM platform
available for quality and process control measurement.
ALTERA S is a multipurpose CMM with the most advanced capabilities
in the compact CMM class.
Innovative multi-sensor ready technology allows you to expand the
capability of your CMM as your requirements change, and without
expensive controller upgrades.
The ALTERA M range of performance CMMs deliver exception
throughput and enhanced precision to the heart of your production.
Exclusively designed for high speed tactile probe scanning and laser
scanner applications, ALTERA M is the preferred choice for automotive
and aerospace OEMs and other manufacturers of performance
critical components.
The ALTERA SL series of ultra-high accuracy CMMs achieve
sub-micron* accuracy.
Drawing on over 50 years of LK CMM experience, the ALTERA SL
has been optimized for the most challenging tasks and highest
precision. The innovative short-leg bridge design increases
accuracy to the highest level for metrology laboratory
equivalent measurement uncertainty.