Jenoptik Product

Waveline – Roughness and Contour Metrology Mobile and stationary systems for efficient, automatable measurements in the metrology lab or in production.

Jenoptik Waveline W800 Series

For reliable results in the minimum amount of time.
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Modular concept for 100-percent accuracy of fit

• Easy-to-use measuring system
• Modern, high-resolution probe system
• High measurement quality thanks to stable mechanics
• Sophisticated probe arm technology
• Unique traverse unit concept for optimum access to measuring positions
• Probe arms with magnetic coupling for fast and easy probe arm change over
• All contour probe arms equipped with an RFID chip for simplified calibration and automatic configuration and easy probe arm change over
• Quick-change adapter QCA enables quick probe system changeover with minimum retooling time and automatic configuration feature
Developed For Complex Professional
Waveline W800
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Overview
W800 measuring systems have been developed for roughness and contour measuring tasks associated with typically manual or semi-automatic measuring processes.The systems are easy to operate and offer a great variety of analyses thanks to the performant measuring and evaluation software Evovis. The result is the highest standard of measuring accuracy in the shortest time.

The quick-change adapter enables probing systems to be swapped over without having to use any tools. Probe arms and probing system are equipped with magnetic coupling making the exchange of probe arms easy and fast. This means you can take a flexible approach towards all of your measuring requirements.

The system automatically detects the intelligent contour probe arms with RFID identification and adjusts the optimal measurement conditions. This means that operating errors and incorrect measurements can be practically eliminated.

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