Jenoptik Product

Waveline – Roughness and Contour Metrology Mobile and stationary systems for efficient, automatable measurements in the metrology lab or in production.

Jenoptik Waveline W900 Series

Modern system concept for optimum flexibility and precision
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Fast measuring axes for high-end performance

• Fast measurement technology
• Highly flexible, dynamic measurement
• Excellent measuring accuracy in combination with Nanoscan probe system
• Dual operation of two probe systems; a roughness probe system can also be installed on the front of the traverse unit; also suitable for optional rotary module
• Optional motorized tilt unit for precise adjustment of the tilt angle and automatic alignment of the probe to the workpiece level
• Extensive options for automated, CNC-controlled measurement runs
• Measuring Z-column with linear scale at a resolution of 0.1 μm for measurement of vertical distances outside the Z measuring range of the probe; requires probe arm with double probe tip
Developed For Complex Professional
Waveline W900
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Overview
The W900 series has been developed for high-performance roughness and contour measuring tasks, e.g. in automated process chain settings. It has two interfaces that allow the probing systems to be coupled, as well as further optional axes for automating measurement processes.

The combination of the Z column with the probing systems, the configuration of which guarantees particularly good access to the measuring positions, extends the scope of functions for measuring vertical distances.

Benefits
• Minimum measuring cycles   • Maximum accuracy   • Maximum flexibility
• QCA Quick Change Adapter

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